"Design for reliability with the advanced integrated circuit (IC) ..."

Zhigang Ji, Haibao Chen, Xiuyan Li (2019)

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DOI: 10.1007/S11432-019-2643-5

access: closed

type: Journal Article

metadata version: 2025-01-19

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Zhigang Ji, Haibao Chen, Xiuyan Li:
Design for reliability with the advanced integrated circuit (IC) technology: challenges and opportunities. Sci. China Inf. Sci. 62(12): 226401 (2019)

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