"Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm."

Tai Song et al. (2020)

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DOI: 10.1109/ACCESS.2020.3016039

access: open

type: Journal Article

metadata version: 2021-09-16

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Tai Song, Huaguo Liang, Tianming Ni, Zhengfeng Huang, Yingchun Lu, Jinlei Wan, Aibin Yan:
Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm. IEEE Access 8: 147965-147972 (2020)

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